goodness-of-fit test
Maximum entropy based testing in network models: ERGMs and constrained optimization
Ghosh, Subhrosekhar, Karmakar, Rathindra Nath, Lahiry, Samriddha
Stochastic network models play a central role across a wide range of scientific disciplines, and questions of statistical inference arise naturally in this context. In this paper we investigate goodness-of-fit and two-sample testing procedures for statistical networks based on the principle of maximum entropy (MaxEnt). Our approach formulates a constrained entropy-maximization problem on the space of networks, subject to prescribed structural constraints. The resulting test statistics are defined through the Lagrange multipliers associated with the constrained optimization problem, which, to our knowledge, is novel in the statistical networks literature. We establish consistency in the classical regime where the number of vertices is fixed. We then consider asymptotic regimes in which the graph size grows with the sample size, developing tests for both dense and sparse settings. In the dense case, we analyze exponential random graph models (ERGM) (including the Erdรถs-Rรจnyi models), while in the sparse regime our theory applies to Erd{รถ}s-R{รจ}nyi graphs. Our analysis leverages recent advances in nonlinear large deviation theory for random graphs. We further show that the proposed Lagrange-multiplier framework connects naturally to classical score tests for constrained maximum likelihood estimation. The results provide a unified entropy-based framework for network model assessment across diverse growth regimes.
Semiparametric KSD test: unifying score and distance-based approaches for goodness-of-fit testing
Goodness-of-fit (GoF) tests are fundamental for assessing model adequacy. Score-based tests are appealing because they require fitting the model only once under the null. However, extending them to powerful nonparametric alternatives is difficult due to the lack of suitable score functions. Through a class of exponentially tilted models, we show that the resulting score-based GoF tests are equivalent to the tests based on integral probability metrics (IPMs) indexed by a function class. When the class is rich, the test is universally consistent. This simple yet insightful perspective enables reinterpretation of classical distance-based testing procedures-including those based on Kolmogorov-Smirnov distance, Wasserstein-1 distance, and maximum mean discrepancy-as arising from score-based constructions. Building on this insight, we propose a new nonparametric score-based GoF test through a special class of IPM induced by kernelized Stein's function class, called semiparametric kernelized Stein discrepancy (SKSD) test. Compared with other nonparametric score-based tests, the SKSD test is computationally efficient and accommodates general nuisance-parameter estimators, supported by a generic parametric bootstrap procedure. The SKSD test is universally consistent and attains Pitman efficiency. Moreover, SKSD test provides simple GoF tests for models with intractable likelihoods but tractable scores with the help of Stein's identity and we use two popular models, kernel exponential family and conditional Gaussian models, to illustrate the power of our method. Our method achieves power comparable to task-specific normality tests such as Anderson-Darling and Lilliefors, despite being designed for general nonparametric alternatives.